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| ELK2012 | Electronics - I | 3+0+2 | ECTS:5 | | Year / Semester | Spring Semester | | Level of Course | First Cycle | | Status | Compulsory | | Department | DEPARTMENT of ELECTRICAL and ELECTRONICS ENGINEERING | | Prerequisites and co-requisites | DC must have been achieved from ELK1002-Fundementals of Electrical Engineering | | Mode of Delivery | Face to face | | Contact Hours | 14 weeks - 3 hours of lectures and 2 hours of laboratory per week | | Lecturer | Prof. Dr. İsmail Hakkı ÇAVDAR | | Co-Lecturer | PROF. DR. İsmail Hakkı ÇAVDAR, | | Language of instruction | Turkish | | Professional practise ( internship ) | None | | | | The aim of the course: | | The students should obtain a basic knowledge on the fundamental components used in electronics. |
| Learning Outcomes | CTPO | TOA | | Upon successful completion of the course, the students will be able to : | | | | LO - 1 : | understand better basic electronics concepts | 1,2,5,11,13 | 1 | | LO - 2 : | understand better semiconductors devices | 1,2,5,11,13 | 1 | | LO - 3 : | analyase V-I characteristic of semiconductor diodes, transistors | 1,2,5,11,13 | 1 | | LO - 4 : | understand better semiconductor diode and transistor circuits | 1,2,5,11,13 | 1 | | CTPO : Contribution to programme outcomes, TOA :Type of assessment (1: written exam, 2: Oral exam, 3: Homework assignment, 4: Laboratory exercise/exam, 5: Seminar / presentation, 6: Term paper), LO : Learning Outcome | | |
| Semiconductor : p-type semiconductor , n-type semiconductor , the p-n junction. Diodes : The open-circuited p-n junction , the Volt-Ampere characteristic , the temperature dependence of the V/ I characteristic , diode resistance , diode capacitance , breakdown diodes , the load-line concept , linear diode model , diode switching times , a breakdown-diode voltage regulator , clipping circuits , rectifiers , other diode circuits , capacitor filters , small-signal analysis. BJT : The junction transistor , transistor construction , the Common-Base (CB) , the Common-Emitter (CE) , the Common-Collector (CC) configurations , on , cutoff , saturation regions , transistor ratings , transistor switching times , the operating point of a BJT , bias stability , self-bias or emitter bias , stabilization against variations in ICO , VBE , and b. JFET : The junction field-effect transistor , the Volt-Ampere characteristic , the enhancement MOSFET , the depletion MOSFET , MOSFET inverter , MOSFET logic gates , complementary MOSFET , the operating point of a JFET. |
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| Course Syllabus | | Week | Subject | Related Notes / Files | | Week 1 | p-type semiconductor, n-type semiconductor, the p-n junction. | | | Week 2 | the current components of a diode, The Volt-Ampere characteristics, the temperature dependence of the V/I charecteristic, application | | | Week 3 | Diode resistance, diode capacitance, diode switching times, application | | | Week 4 | zener diode, tunnel diode, the load-line concept, linear diode model | | | Week 5 | Fotodiode, led, display, fotovoltaic effect | | | Week 6 | Clipping circuits, clamping circuits, application | | | Week 7 | Rectifiers, other diode circuits | | | Week 8 | The junction transistor, the Common-Base(CB), the Common-Emiter(CE), the Common-Collector(CC) configurations. | | | Week 9 | Mid-term exam | | | Week 10 | on, cutoff, saturation regions of a BJT, application | | | Week 11 | Foto transistor, transistors switching times, the operation points of BJT | | | Week 12 | Bias stability | | | Week 13 | The junction field-effect transistor, the Volt-Ampere characteristic | | | Week 14 | MOSFET, the MOSFET types | | | Week 15 | MOSFET circuits,CMOS, the operation point of a JFET, application | | | Week 16 | End-of-term exam | | | |
| 1 | Millman, J. 1985, MICROELECTRONICS :Digital and Analog Circuits and Systems, McGraw-HILL. | | | |
| 1 | Demircioğlu, Türen, 2000, Electronic Circuits: Solved Problems. | | | 2 | Millman, J., 1988, MICROELECTRONICS, McGraw-HILL. | | | 3 | Boylestad, R. / Nashelsky, L.,1972, Electronic Devices and Circuit Theory, Prentice-HALL. | | | 4 | Schilling D. L. / Belove, C., 1989, ELECTRONIC CIRCUITS, McGraw-HALL. | | | |
| Method of Assessment | | Type of assessment | Week No | Date | Duration (hours) | Weight (%) | | Mid-term exam | 9 | | 2 | 50 | | End-of-term exam | 16 | | 2 | 50 | | |
| Student Work Load and its Distribution | | Type of work | Duration (hours pw) | No of weeks / Number of activity | Hours in total per term | | Yüz yüze eğitim | 3 | 14 | 42 | | Sınıf dışı çalışma | 2 | 14 | 28 | | Arasınav için hazırlık | 15 | 1 | 15 | | Arasınav | 2 | 1 | 2 | | Dönem sonu sınavı için hazırlık | 18 | 1 | 18 | | Dönem sonu sınavı | 2 | 1 | 2 | | Diğer 1 | 18 | 1 | 18 | | Diğer 2 | 2 | 1 | 2 | | Total work load | | | 127 |
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